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BIST

May 24, 2015, anysilicon

BIST is the acronym for Built-in Self Test and it refers to the logic on the chip that is dedicated to test some other portion of digital logic on the chip. BIST is typically used to verify the functionality of chip in safety-critical applications where it is necessary to ascertain that the chip is functioning well before start-up. For example: the chip design to open the airbag in an automotive vehicle needs to checked before the engine is turned-on to make sure that in event of an accident the air-bag does open up!

 

BIST may be of various sub-types. LBIST (Logical Built-in Self Test) is used to test the digital logic or an IP. MBIST (Memory Built-in Self Test), on the other hand, is used to test memories.