Moortec

UK

moortec-logo-new-trade

Moortec provides compelling embedded subsystem IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm.

 

Moortec’s in-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems. Moortec provides excellent support for IP application, integration and device test during production.

 

Our high-performance analog and mixed-signal IP designs are delivered to ASIC and System on Chip (SoC) technologies within the consumer, mobile, automotive, high performance computing and telecommunications sectors.

Services

IP Vendor

Established in 2005 Moortec provides compelling embedded subsystem IP solutions for Process, Voltage & Temperature (PVT) monitoring, targeting advanced node CMOS technologies from 40nm down to 7nm. Moortec’s in-chip sensing solutions support the semiconductor design community’s demands for increased device reliability and enhanced performance optimization, enabling schemes such as DVFS, AVS and power management control systems. Moortec provides excellent support for IP application, integration and device test during production.

IP Cores

Process Monitors

The process variability of advanced CMOS technologies has become a significant factor to the speed and power performance of SoC devices. Moortec’s Process Detector (PD) will allow an IC to self-determine its own manufactured process characteristics, providing information for system optimisation on a PER DIE basis.

 

Moortec’s embedded PD IP addresses the following applications:

 

  • Detect silicon speed type (FAST/SLOW/TYP)
  • System performance optimisation
  • Age monitoring
  • Critical voltage and timing analysis

 

The Process Detector is easy to integrate, compatible with standard CMOS processes, and has several digital interfacing options for easy control and data capture.

Voltage Monitors

Voltage supplies on advanced node CMOS devices are subject to electrical noise, supply perturbations, transient events and glitches. Moortec’s range of voltage monitoring IP enables chip developers to measure conditions on-chip, hence allowing supply events to be detected and system performance to be optimised.

 

  • On-chip Core & I/O supply monitoring
  • Low supply voltage alarms
  • IR Drop monitoring for core logic
  • Transient and glitch detection
  • Dynamic Voltage & Frequency Scaling (DVFS) schemes

Temperature Sensors

The on-chip thermal monitoring and management of advanced node designs is a critical consideration for SoC developers. Moortec’s range of high accuracy Temperature Sensor IP allows for device performance optimisation and device characterisation.

 

  • Fine-Grain Dynamic Voltage & Frequency Scaling (DVFS) schemes
  • Device characterisation
  • Thermal runaway avoidance
  • Thermal profiling, security and thermal (fan) control
  • Life-time reliability monitoring
  • 40nm, 28nm and FinFET

PVT Controller

The PVT Controller provides a single standard interface to Moortec’s embedded Process, Voltage and Temperature (PVT) sensing Sub-System used to increase System on Chip performance and reliability.

 

On-chip PVT monitoring is now a key consideration for 28-nanometer (nm) and FinFET technology based designs. Higher accuracy monitors embedded within SoC designs enable a greater opportunity for dynamic performance optimisation, either for lower power or higher data throughput as well as offering greater device reliability. Sensing die temperature, detecting logic speed and monitoring voltage supply levels can be used intelligently to vary system clock frequencies and the voltage levels of supply domains. A benefit of embedded thermal monitoring in particular is to enhance device reliability and life-time by assessing the electromigration effects of hot spots within the chip.

 

A key aspect is that PVT data collection can be applied to each and every device, either during production or ‘in-the-field’. Moortec believe that strategies adopted by IC designers over the coming years will be heavily influenced by the analysis of data harvested from in-chip monitors.