Author Archives: anysilicon

Name: anysilicon

5 Reasons Why In-Chip Monitoring is Here to Stay

When the first car rolled off his production line in 1913, Henry Ford would have already envisioned just how prolific the automobile would become. However, would he have foreseen the extent to which monitors and sensors would become critical to the modern internal combustion engine?
 

 
The requirement

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The Wafer Quiz – By AnySilicon

 
[wp_quiz id=”4972″]

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Dolphin Integration announces the availability of the new generation 28 nm SpRAM generator

News

Launching any low-power SoC on a highly competitive market requires true differentiating factors. For IoT applications requiring ultra low-power solutions to extend battery life-time for wireless-connected devices, SoC architects optimize power modes by partitioning the SoC. This minimizes dynamic power in active modes, as well as power leakage in stand-by

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DDR4 Set to Account for Largest Share of DRAM Market by Architecture

The new, higher-speed DDR4 DRAM generation gained significant marketshare in 2016, representing 45% of total DRAM sales. Previously, DDR3 DRAM, including low-power versions used in tablets, smartphones, and notebook PCs, accounted for 84% of total DRAM sales in 2014 and 76% in 2015, but in 2016, DDR4 price premiums evaporated

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Xcerra Corporation to be Acquired by Unic Capital Management

Xcerra Corporation (NASDAQ:XCRA) and Sino IC Capital Co. Ltd. today announced that Xcerra and an affiliate of Sino IC Capital , Unic Capital Management Co., Ltd., have entered into a definitive agreement under which Unic Capital Management Co., Ltd., will acquire all outstanding shares of Xcerra for $10.25 per share

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Solido Launches Machine Learning Characterization Suite

San Jose, CA – April 6, 2017 – Solido Design Automation, a leading provider of variation-aware design and characterization software, today announced the immediate release of its Machine Learning (ML) Characterization Suite. This new product uses machine learning to significantly reduce standard cell, memory, and I/O characterization time, helping semiconductor

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