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Wafer Test

August 08, 2018, anysilicon

Wafer test (or wafer probe or wafer sort) is a simple electrical test, that is perform on a silicon die while it’s in a wafer form. Wafer sort’s main purpose is to identify the non-functional dies and thereby avoiding assembly of those dies into packages. In many cases, wafer sort is a simple and quick test that focuses on a few electrical parameters that are most likely to fail.

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