Comport Data

Please see our portfolio here: http://www.comport-data.com/asic-portfolio/

Comport Data has extensive experience in ASIC design using CMOS, BiCMOS and Bipolar technologies. We design complex mixed-signal analog-digital integrated circuits from concept to silicon.

TECHNOLOGY

• CMOS (analog design and mixed-signal design)
• BiCMOS
• Bipolar

SILICON FOUNDRY INTERFACE

• Design Rule Check (DRC)
• Layout Parasitic Extraction (LPE)
• Electrical Rule Check (ERC)
• Layout Versus Schematic (LVS)

FOUNDRIES

Comport Data is a fab-independent ASIC design supplier and has close connections with several CMOS, BiCMOS, and Bipolar foundries to manufacture its mixed-signal and analog integrated circuits.

Included among the foundries most recently used by Comport Data engineers are: XFAB, TSMC and AMS.

See more: http://www.comport-data.com/asics/asic-design/

Comport Data offers pre-production runs up to high volume testing for each ASIC design project, including wafer and package verification using in-house wafer probers and handlers. We can also migrate or develop new test programs for existing products.

IN-HOUSE CHARACTERIZATION AND PRODUCTION TESTING EQUIPMENT

• Testers: Mixed signal custom-made testers, designed and built for interfacing to Wafer probers and SMD & DIL handlers.
• Wafer Probers: Electroglass 6″ & 8″ wafers with hot chuck system and inker.
• Handlers: Multi-sites Exatron handlers for testing of most popular packages.
• Temperature Testing: TestEquity temperature chamber programmable for fast-cycling full military range temperature testing.
• Analytical Probers: Wentworth Labs probing station with Bausch & Lomb Micro-zoom microscope.
• Baking equipment for moisture removal per JEDEC J-STD-033.
• Miscellaneous: Electrical fault detection using Liquid Crystal thermal analysis.

EXTERNAL RESOURCES USED FOR FAILURE ANALYSIS

• Focused Ion Beam (FIB) system for modifying and analyzing multi-layered IC structures.
• Electrostatic Discharge verification (ESD).
• Photon emission microscopy (PEM) for latchup detection.

See more: http://www.comport-data.com/asics/asic-testing/

We develop Mixed-Signal ASICs for advanced signal-processing applications in commercial, industrial and medical fields. Our expertise in multi-channel Readout circuits resulted in the design and manufacturing of several ASIC products dedicated specifically for X-Ray scanners and CT-Scan systems. ASICs can be provided in low or high volume as diced wafers and packaged chips.

See more: http://www.comport-data.com/asics/asic-products/

Please read more about Comport Date here: http://www.comport-data.com/about-comport-data/

Please contact us via this link: http://www.comport-data.com/contact-comport-data-asic/