Comport Data


Comport Data Inc. is an integrated circuit design, manufacturing and testing company offering a wide range of ASIC design services from analog ASIC design, mixed-signal design, layout, FAB-ing, packaging and production testing services. The company specializes in advanced mixed-signal ASIC designs, ranging from complex system-on-chip mixed-signal ASICs with integrated analog circuit functions and embedded microcontrollers, to very low noise, multi-channels A/D and D/A devices, for the acquisition, amplification and conversion of very small signals. Comport Data engineers have a solid know-how for implementing low voltage/low power, high voltage, high frequency and smart power designs.


Mixed-Signal ASIC Designs Portfolio


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ASIC Design

Comport Data has extensive experience in ASIC design using CMOS, BiCMOS and Bipolar technologies. We design complex mixed-signal analog-digital integrated circuits from concept to silicon.

  • CMOS (analog design and mixed-signal design)
  • BiCMOS
  • Bipolar
  • Design Rule Check (DRC)
  • Layout Parasitic Extraction (LPE)
  • Electrical Rule Check (ERC)
  • Layout Versus Schematic (LVS)

Comport Data is a fab-independent ASIC design supplier and has close connections with several CMOS, BiCMOS, and Bipolar foundries to manufacture its mixed-signal and analog integrated circuits.

Included among the foundries most recently used by Comport Data engineers are: XFAB, TSMC and AMS.


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ASIC Testing

Comport Data offers pre-production runs up to high volume testing for each ASIC design project, including wafer and package verification using in-house wafer probers and handlers. We can also migrate or develop new test programs for existing products.



  • Testers: Mixed signal custom-made testers, designed and built for interfacing to Wafer probers and SMD & DIL handlers.
  • Wafer Probers: Electroglass 6″ & 8″ wafers with hot chuck system and inker.
  • Handlers: Multi-sites Exatron handlers for testing of most popular packages.
  • Temperature Testing: TestEquity temperature chamber programmable for fast-cycling full military range temperature testing.
  • Analytical Probers: Wentworth Labs probing station with Bausch & Lomb Micro-zoom microscope.
  • Baking equipment for moisture removal per JEDEC J-STD-033.
  • Miscellaneous: Electrical fault detection using Liquid Crystal thermal analysis.




  • Focused Ion Beam (FIB) system for modifying and analyzing multi-layered IC structures.
  • Electrostatic Discharge verification (ESD).
  • Photon emission microscopy (PEM) for latchup detection.


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We develop Mixed-Signal ASICs for advanced signal-processing applications in commercial, industrial and medical fields. Our expertise in multi-channel Readout circuits resulted in the design and manufacturing of several ASIC products dedicated specifically for X-Ray scanners and CT-Scan systems. ASICs can be provided in low or high volume as diced wafers and packaged chips.


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Comport Data


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