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IC Testing

March 17, 2019, anysilicon

An integrated circuit or IC is a semiconductor chip which houses a large circuitry, capable of executing complex tasks and functions. In order to test whether or not an IC is in working order, engineers test ICs in 2 levels: wafer level testing and package level testing.

 

There are essentially four general tests one can conduct to check the condition of the IC: shorting condition, leakage condition, supply conditions, and input and output conditions. Each of these tests serves to check and verify the integrity of a different parts of the chip in hopes of identifying any issues so that you scrap the bad IC.

 

Further reading: A Guide to Semiconductor Wafer Test

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