Category Archives: Testing

Presto Engineering Announces Management Expansion

June 29, 2017, anysilicon

preseto management

Presto Engineering, Inc., an outsourced operations provider to semiconductor and Internet of Things (IoT) device manufacturers, announces a management expansion: Cedric Mayor has been named Chief Operating Officer (COO) and Martin Kingdon has been appointed VP Sales.
 
“We have experienced growing demand for IoT and related turnkey production &

Read More

Presto Engineering Launches New Image Sensor Turnkey Services

June 16, 2017, anysilicon

cis

Presto Engineering Inc., an outsourced operations provider to semiconductor and Internet of Things (IoT) device manufacturers, now offers a turnkey industrialization service for image sensors. The industry has experienced an increase in demand for these sensors, which are often used in devices that connect to the internet (IoT).
 
“A

Read More

IC Test Flow For Advanced Semiconductor Packages

May 24, 2017, anysilicon

daisychain

Higher bus speeds and lower power consumption are design criteria for most modern digital electronic products. Packaging solutions that provide higher bus speeds at reduced power per bit ratios require design techniques that shorten the distance between chips (to reduce drive currents) and use wider data buses (with finer line-space

Read More

Xcerra Corporation to be Acquired by Unic Capital Management

April 11, 2017, anysilicon

xcerra

Xcerra Corporation (NASDAQ:XCRA) and Sino IC Capital Co. Ltd. today announced that Xcerra and an affiliate of Sino IC Capital , Unic Capital Management Co., Ltd., have entered into a definitive agreement under which Unic Capital Management Co., Ltd., will acquire all outstanding shares of Xcerra for $10.25 per share

Read More

The Ultimate Guide to Wafer Sort

January 25, 2017, anysilicon

wafer sort feature

You may have heard of wafer sort or wafer testing, which is a part of the testing process performed on silicon wafers. Wafer sort is a simple electrical test, that is perform on a silicon die while it’s in a wafer form. Wafer sort’s main purpose is to identify the

Read More

Managing Semiconductor Test Data in Current Age

December 06, 2016, anysilicon

yield

We are living in a fast changing environment, from light bulbs to cars, everything is getting advanced and more efficient. The functionalities of electronic devices are increasing and the associated costs to produce them are decreasing, intensifying the competition. In such a scenario, it becomes challenging and difficult to sustain

Read More