Category Archives: Testing
What is a Probe Card?
A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated circuits located on a wafer to the ATE (Automated Test Equipment) in order to test their electrical parameters and performance before
Read MorePresto Engineering’s Extensive Test Capabilities Enable It to Offer Customers Parallel Testing of Automotive Products to Provide Much Faster Time to Market
Automotive electronics testing is one of the most exacting of all test and qualification protocols before production release because of the safety and liability considerations. The AEC Q100 revisions, ZVEI and its French equivalent SIA for accelerated environment stress tests not only list the time or number of cycles that
Read MoreRoodMicrotec reports its strongest first half‐year sales in 7 years
RoodMicrotec N.V., the leading independent company for semiconductors supply and quality services, increased its half year sales by 17 percent year‐on‐year due to its strong ordering intake, especially in the areas Test Operations and Supply Chain Management. Within the markets, RoodMicrotec raised its sales in the industrial sector by 17
Read MoreVTRAN by Source III Supports Advantest SmarTest 8 Translations
Advantest has announced a new programming environment, known as SmarTest 8, for the popular V93000 tester. As more and more users switch to SmarTest 8, it becomes important to have a vector translation tool capable of converting between popular vector formats and SmarTest 8.
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Presto Engineering offers specialised testing service for CMOS Image Sensors
esting CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically
Read MorePresto Engineering Provides High-Volume Wafer-Level Test for Maja Systems Wireless Data-Center Connectivity Solutions
Presto Engineering Inc., an outsourced operations provider to semiconductor and Internet of Things (IoT) device manufacturers, and Maja Systems, a world-leading designer of millimeter wave (mmWave) connectivity and sensing solutions, jointly announce their successful collaboration in comprehensive wafer-level ATE for the Maja AirData™ family of terabit connectivity and data transport solutions.
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