Category Archives: Testing

Presto Engineering offers specialised testing service for CMOS Image Sensors

March 14, 2018, anysilicon

esting CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically

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Presto Engineering Provides High-Volume Wafer-Level Test for Maja Systems Wireless Data-Center Connectivity Solutions

March 07, 2018, anysilicon

Presto Engineering Inc., an outsourced operations provider to semiconductor and Internet of Things (IoT) device manufacturers, and Maja Systems, a world-leading designer of millimeter wave (mmWave) connectivity and sensing solutions, jointly announce their successful collaboration in comprehensive wafer-level ATE for the Maja AirData™ family of terabit connectivity and data transport solutions.
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CEO Talk: Scott Bulbrook

March 05, 2018, anysilicon

This interview was held with Scott Bulbrook,  Managing Partner, VP of Engineering at DA-Integrated.
 

 
Tell me a bit about your background? How did you first get started with DA-Integrated?
 
I have always had a passion for the semiconductor industry. At university Semiconductor Physics was my favorite course. I

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The True Cost of IC Test

December 14, 2017, anysilicon

The other day I was having lunch with a friend I had not seen in some time who had recently come back from a ten-day trip overseas. This was his sixth such trip in the past twelve months made to check on production test activities at the OSAT his company

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DA-Integrated Selects Chroma 3650 Test System

November 13, 2017, anysilicon

DA-Integrated, a full-service IC Design, Supply and Test services provider in Ottawa, Canada and Chroma, a Tier 1 Taiwanese Test Equipment manufacturer announce today that DA-Integrated has selected and installed the Chroma 3650 series ATE system. The Chroma 3650’s highly flexible configuration, and best in class production test rates make

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Guide to Semiconductor Wafer Sort

October 19, 2017, anysilicon

Wafer sort (or wafer test), is a part of the testing process performed on silicon wafers. Wafer sort is a simple electrical test, that is performed on a silicon die while it’s in a wafer form.
 
Wafer sort’s main purpose is to identify the non-functional dies and thereby avoiding

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