March 14, 2018, anysilicon
esting CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically
Read MoreMarch 07, 2018, anysilicon
Presto Engineering Inc., an outsourced operations provider to semiconductor and Internet of Things (IoT) device manufacturers, and Maja Systems, a world-leading designer of millimeter wave (mmWave) connectivity and sensing solutions, jointly announce their successful collaboration in comprehensive wafer-level ATE for the Maja AirData™ family of terabit connectivity and data transport solutions.
March 05, 2018, anysilicon
This interview was held with Scott Bulbrook, Managing Partner, VP of Engineering at DA-Integrated.
Tell me a bit about your background? How did you first get started with DA-Integrated?
I have always had a passion for the semiconductor industry. At university Semiconductor Physics was my favorite course. I
December 14, 2017, anysilicon
The other day I was having lunch with a friend I had not seen in some time who had recently come back from a ten-day trip overseas. This was his sixth such trip in the past twelve months made to check on production test activities at the OSAT his company
Read MoreNovember 13, 2017, anysilicon
DA-Integrated, a full-service IC Design, Supply and Test services provider in Ottawa, Canada and Chroma, a Tier 1 Taiwanese Test Equipment manufacturer announce today that DA-Integrated has selected and installed the Chroma 3650 series ATE system. The Chroma 3650’s highly flexible configuration, and best in class production test rates make
Read MoreOctober 19, 2017, anysilicon
Wafer sort (or wafer test), is a part of the testing process performed on silicon wafers. Wafer sort is a simple electrical test, that is performed on a silicon die while it’s in a wafer form.
Wafer sort’s main purpose is to identify the non-functional dies and thereby avoiding
