Category Archives: Testing
Mentor Graphics Acquires Galaxy Semiconductor
Mentor Graphics Corporation today announced that it has acquired Galaxy Semiconductor, a leading provider of test data analysis and defect reduction software for the semiconductor industry. With this acquisition, more design, test, and product engineers will now have access to Galaxy’s powerful solutions for maximizing device yields, improving test quality,
Read MoreTrends in DFT and Production Test for IoT Devices
Some years ago the term “System On a Chip”, shortened to “SOC”, was coined to describe chips that integrated into themselves the functions of several other chips in an electronic system. The point of this was obviously to reduce cost and form factor in situations where the cost and effort
Read MoreTeradyne – Company Overview
Located in North Reading, Massachusetts, Teradyne is a supplier and developer of automatic test equipment for a number of large companies. The Semiconductor Test and Systems Test Group offers their services to a number of customers, including high profile companies such as Intel, Samsung, and IBM.
The name Teradyne
Advantest – Company Overview
One of the leading manufacturers of automatic test equipment, Advantest has proven to be one of the leading lights in the semiconductor industry. In addition, they manufacture measuring instruments that are used in the creation of electronic system. You can find Advantest products used in the creation of digital consumer
Read MoreIDDQ Testing
Iddq testing is one of the many ways to test CMOS integrated circuits in production. These circuits are usually tested as a way to find different types of manufacturing faults. Electric faults can be a major hazard and it can even lead to fatalities. This method relies on measuring the
Read MoreScan Test Power Normalization Using Hierarchical Test Flow
Introduction
Low power test efforts in SOC design are broadly classified into – fine tuning ATPG patterns, enhancing collaterals for supporting low power ATPG, architecture for low power DFT, improving estimation and correlation. The flow discussed here comes under the category of “fine tuning ATPG patterns”.
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