ATPG

Automatic Test Pattern Generation or ATPG is a method of testing ICs in production by using a patterns generated by an EDA tool.

The patterns are sent into the Device Under Test and then received by the tester which then can detect production errors.

Recent Stories

Cadence to Acquire Secure-IC, a Leader in Embedded Security IP

Cadence to Acquire Secure-IC, a Leader in Embedded Security IP

Understanding Multi Chip Module (MCM)

Understanding Multi Chip Module (MCM)

Understanding Heterogeneous Integration (HI)

Micross Acquires Integra Technologies, Creating the Leading U.S. Domiciled OSAT Provider

Micross Acquires Integra Technologies, Creating the Leading U.S. Domiciled OSAT Provider

onsemi Acquires Silicon Carbide JFET Technology to Enhance Its Power Portfolio for AI Data Centers

onsemi Acquires Silicon Carbide JFET Technology to Enhance Its Power Portfolio for AI Data Centers

Introduction to Chip Scale Packaging

Introduction to Chip Scale Packaging

Semiconductor Trends Shaping 2025

Semiconductor Trends Shaping 2025

CAST to Enter the Post-Quantum Cryptography Era with New KiviPQC-KEM IP Core

CAST to Enter the Post-Quantum Cryptography Era with New KiviPQC-KEM IP Core