Category Archives: Qualification

Managing Space Grade RF Device Qualifications

What quality of on-board devices and components do you think are chosen for space missions? The answer is of course devices and components built to survive the most intense environmental factors presented in space.
To support our partners and industry colleagues, we’ve developed this blog to highlight the most important

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Criteria Labs Expands Manufacturer’s Representatives to Better Serve Customers Throughout the United States and Canada

Austin, TX.– June 1, 2021—Criteria Labs, an industry leader in high performance RF space components and semiconductor engineering solutions has partnered with Manufacturer’s Representatives to meet the needs of its growing customer base. The firms will support Criteria Labs’ space qualified device, eutectic die attachment, die to shim attachment, chip

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CRITERIA LABS EXPANDS CAPABILITIES, INTRODUCES HIGH RELIABILITY RF SPACE AND DEFENSE SOLUTIONS

Criteria Labs, an industry leader in high performance RF space components and semiconductor solutions recently unveiled its latest products for demanding military and space applications. Criteria Labs’ Gain Blocks, GaN Power Amplifiers, Multi-Chip-Modules, and Solid-State Power Amplifiers are built to function in harsh environments. The newly released products can be

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Understanding High Temperature Storage Life (HTSL) in IC Qualification

For ASIC or IC, there are recommended environmental conditions for their storage which allows them to perform at proper functionally. However, it is well known that storage may not always be close to the recommended standard. This is where the high temperature storage life (HTSL) test comes into play, testing

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Understanding Highly Accelerated Stress Test (HAST) in IC Qualification

The highly accelerated stress test (HAST) involves the effects of humidity and temperature on an IC or ASIC. The HAST is designed to test the package of the ASIC under extreme humidity and temperature conditions. Devices that pass such tests will be able to withstand the normal rigors of temperature

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Understanding ESD CDM in IC Design

In addition to the human body model (HBM) which is used to measure the electro-static discharge (ESD) that may affect IC/ASIC devices, there is also damage that may come from charged device model (CDM) which also must be tested. Although superficially similar to the HBM, the CDM is different and

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