Category Archives: Qualification
Managing Space Grade RF Device Qualifications
What quality of on-board devices and components do you think are chosen for space missions? The answer is of course devices and components built to survive the most intense environmental factors presented in space.
To support our partners and industry colleagues, we’ve developed this blog to highlight the most important
Criteria Labs Expands Manufacturer’s Representatives to Better Serve Customers Throughout the United States and Canada
Austin, TX.– June 1, 2021—Criteria Labs, an industry leader in high performance RF space components and semiconductor engineering solutions has partnered with Manufacturer’s Representatives to meet the needs of its growing customer base. The firms will support Criteria Labs’ space qualified device, eutectic die attachment, die to shim attachment, chip
Read MoreCRITERIA LABS EXPANDS CAPABILITIES, INTRODUCES HIGH RELIABILITY RF SPACE AND DEFENSE SOLUTIONS
Criteria Labs, an industry leader in high performance RF space components and semiconductor solutions recently unveiled its latest products for demanding military and space applications. Criteria Labs’ Gain Blocks, GaN Power Amplifiers, Multi-Chip-Modules, and Solid-State Power Amplifiers are built to function in harsh environments. The newly released products can be
Read MoreUnderstanding High Temperature Storage Life (HTSL) in IC Qualification
For ASIC or IC, there are recommended environmental conditions for their storage which allows them to perform at proper functionally. However, it is well known that storage may not always be close to the recommended standard. This is where the high temperature storage life (HTSL) test comes into play, testing
Read MoreUnderstanding Highly Accelerated Stress Test (HAST) in IC Qualification
The highly accelerated stress test (HAST) involves the effects of humidity and temperature on an IC or ASIC. The HAST is designed to test the package of the ASIC under extreme humidity and temperature conditions. Devices that pass such tests will be able to withstand the normal rigors of temperature
Read MoreUnderstanding ESD CDM in IC Design
In addition to the human body model (HBM) which is used to measure the electro-static discharge (ESD) that may affect IC/ASIC devices, there is also damage that may come from charged device model (CDM) which also must be tested. Although superficially similar to the HBM, the CDM is different and
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