Criteria Labs, an industry leader in high performance RF space components and semiconductor solutions recently unveiled its latest products for demanding military and space applications. Criteria Labs’ Gain Blocks, GaN Power Amplifiers, Multi-Chip-Modules, and Solid-State Power Amplifiers are built to function in harsh environments. The newly released products can be
Read More
For ASIC or IC, there are recommended environmental conditions for their storage which allows them to perform at proper functionally. However, it is well known that storage may not always be close to the recommended standard. This is where the high temperature storage life (HTSL) test comes into play, testing
Read MoreThe highly accelerated stress test (HAST) involves the effects of humidity and temperature on an IC or ASIC. The HAST is designed to test the package of the ASIC under extreme humidity and temperature conditions. Devices that pass such tests will be able to withstand the normal rigors of temperature
Read More
In addition to the human body model (HBM) which is used to measure the electro-static discharge (ESD) that may affect IC/ASIC devices, there is also damage that may come from charged device model (CDM) which also must be tested. Although superficially similar to the HBM, the CDM is different and
Read MoreIn building integrated circuits (ICs) or ASICs, one area of concern is how they are protected from outside electrical sources. While most systems are geared towards power overloads, one source that may cause considerable damage is the electro-static discharge (ESD) that comes from the human body. To help test for
Read More
Many IC designers pay little attention to IC qualification and consequently pay high price and delays before the chip reaches to high volume. The mindset of experienced IC designers is considering IC quality (and production test) through all phases of the IC design process. Today, more than ever, re-tapeout is
Read More