November 20, 2019, anysilicon
The Mayflower Steps, where the Pilgrims are believed to have embarked on their journey to America, are located in the beautiful Barbican area of Plymouth, a small town in the southwest of England. As the lone American working for Moortec, a British company based in Plymouth, I stood and stared at
Read MoreJuly 05, 2019, anysilicon
A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated circuits located on a wafer to the ATE (Automated Test Equipment) in order to test their electrical parameters and performance before
Read MoreNovember 22, 2018, anysilicon
Automotive electronics testing is one of the most exacting of all test and qualification protocols before production release because of the safety and liability considerations. The AEC Q100 revisions, ZVEI and its French equivalent SIA for accelerated environment stress tests not only list the time or number of cycles that
Read MoreJuly 09, 2018, anysilicon
RoodMicrotec N.V., the leading independent company for semiconductors supply and quality services, increased its half year sales by 17 percent year‐on‐year due to its strong ordering intake, especially in the areas Test Operations and Supply Chain Management. Within the markets, RoodMicrotec raised its sales in the industrial sector by 17
Read MoreApril 17, 2018, anysilicon
Advantest has announced a new programming environment, known as SmarTest 8, for the popular V93000 tester. As more and more users switch to SmarTest 8, it becomes important to have a vector translation tool capable of converting between popular vector formats and SmarTest 8.
Source III is proud to
March 14, 2018, anysilicon
esting CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically
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