Category Archives: Testing

A Historical Case for DFT – or how the verification Pilgrims didn’t do their jobs

November 20, 2019, anysilicon

The Mayflower Steps, where the Pilgrims are believed to have embarked on their journey to America, are located in the beautiful Barbican area of Plymouth, a small town in the southwest of England. As the lone American working for Moortec, a British company based in Plymouth, I stood and stared at

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What is a Probe Card?

July 05, 2019, anysilicon

A probe card is essentially an interface or a board that is used to perform wafer test for a semiconductor wafer. It is used to connect to the integrated circuits located on a wafer to the ATE (Automated Test Equipment) in order to test their electrical parameters and performance before

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Presto Engineering’s Extensive Test Capabilities Enable It to Offer Customers Parallel Testing of Automotive Products to Provide Much Faster Time to Market

November 22, 2018, anysilicon

Automotive electronics testing is one of the most exacting of all test and qualification protocols before production release because of the safety and liability considerations. The AEC Q100 revisions, ZVEI and its French equivalent SIA for accelerated environment stress tests not only list the time or number of cycles that

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RoodMicrotec reports its strongest first half‐year sales in 7 years

July 09, 2018, anysilicon

RoodMicrotec N.V., the leading independent company for semiconductors supply and quality services, increased its half year sales by 17 percent year‐on‐year due to its strong ordering intake, especially in the areas Test Operations and Supply Chain Management. Within the markets, RoodMicrotec raised its sales in the industrial sector by 17

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VTRAN by Source III Supports Advantest SmarTest 8 Translations

April 17, 2018, anysilicon

Advantest has announced a new programming environment, known as SmarTest 8, for the popular V93000 tester. As more and more users switch to SmarTest 8, it becomes important to have a vector translation tool capable of converting between popular vector formats and SmarTest 8.
 
Source III is proud to

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Presto Engineering offers specialised testing service for CMOS Image Sensors

March 14, 2018, anysilicon

esting CMOS image sensors on a wafer-size scale is not easy because of the challenges of creating uniform illumination over a large area. Presto Engineering has developed a custom, computer-controlled solution that illuminates sections of the wafer in turn. Integrating the results enables the whole wafer to be tested automatically

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