Category Archives: Testing

Teradyne Marks 8,000th J750 Semiconductor Test System Shipment

NORTH READING, MA / ACCESSWIRE / May 21, 2024 / Teradyne, Inc. (NASDAQ:TER), a leading supplier of automated test equipment, today announced shipment of its 8,000th J750 semiconductor test platform. This milestone has been achieved with V-Test, a leading outsourced semiconductor assembly and test (OSAT) vendor in China.

 
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First OSAT in the Middle East: Israel Strengthens Semiconductor Independence by Uniting iNPACK Expertise with ATS Engineering

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iNPACK (a PCB Technologies Ltd. Company) and cutting-edge IC packaging and assembly house in Israel, in conjunction with ATS Engineering, a leading IC Test House based in Israel, have announced a transformative collaboration in order to establish the first Outsourced Semiconductor Assembly and Test (OSAT) facility in the Middle East. This pioneering venture aims to

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Presto and T&W Engineering Announce Long-Term Partnership to Advance Wearable Brain Sensing

Meyreuil, France—November 2, 2023—Presto Engineering, a European leading expert in application-specific integrated circuit (ASIC) design and semiconductor engineering and production services, and T&W Engineering, the leading in-ear electroencephalogram (EEG) wearable device developer and provider of artificial intelligence (AI)-driven EEG reading services, today announced their collaboration to develop an ASIC for measuring

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Presto Engineering Announces its Collaboration with Nokia as Part of France 2030 Investment Plan

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Meyreuil, France – October 5, 2023 – Presto Engineering, a recognized expert in ASIC design and semiconductor engineering and production services, is pleased to announce its collaboration with Nokia for the industrialization of new equipment designed to build the foundations of the next generation of microwave links as part of

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Understanding Semiconductor Testing

Imagine launching a groundbreaking smartphone, only to discover that a significant percentage of the devices are faulty, leading to massive recalls, disappointed customers, and financial losses. Or, even graver, consider an autonomous car failing mid-journey due to a chip malfunction, jeopardizing passenger safety. Such scenarios aren’t mere conjectures—they highlight the

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How to Optimize IC Test Time

Optimizing ASIC test time is a critical factor in semiconductor manufacturing to enhance efficiency, reduce costs and improve time to market. In this article we will provide strategies you can use and implement in your design to help reduce IC test time. One can consider the following benefits:
 
Increased

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