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HTOL

HTOL (High Temperature Operating Life) is a stress test defined by JEDEC to define the reliability of IC products, and is an essential part of chip qualification tests.

Recent Stories

Cortus Announces Two New RISC-V Microcontrollers (MCUs)

Cortus Announces Two New RISC-V Microcontrollers (MCUs)

Tiempo Secure gears for further expansion with Mikael Dubreucq and Frederic Heitzmann hired in newly created key positions

Tiempo Secure gears for further expansion with Mikael Dubreucq and Frederic Heitzmann hired in newly created key positions

2023 Semi Capex Forecast Sees Largest Decline Since 2008-09

2023 Semi Capex Forecast Sees Largest Decline Since 2008-09

After 1Q23 Bottom, Expectations Increase for a 2Q23 IC Market Rebound

After 1Q23 Bottom, Expectations Increase for a 2Q23 IC Market Rebound

Weebit Nano receives from SkyWater Technology the first silicon wafers it manufactured with embedded Weebit ReRAM

Weebit Nano receives from SkyWater Technology the first silicon wafers it manufactured with embedded Weebit ReRAM

Amkor Leverages Its Global Automotive Leadership to Support European Semiconductor Ecosystem

Amkor Leverages Its Global Automotive Leadership to Support European Semiconductor Ecosystem

Secure-IC acquires Silex Insight’s security business to accelerate its chip-to-cloud plan and develop the next-generation of embedded cybersecurity solutions

Secure-IC acquires Silex Insight’s security business to accelerate its chip-to-cloud plan and develop the next-generation of embedded cybersecurity solutions

Introduction to Extrinsic Semiconductors

Introduction to Extrinsic Semiconductors