Find IC test socket

IC Test Socket Manufacturers & Suppliers

Find qualified IC test socket manufacturers for engineering, characterization, validation, burn-in and production test. Compare suppliers for BGA, QFN, WLCSP, LGA, high-frequency and custom test socket requirements.

Submit your requirements once and connect with relevant test socket suppliers.

What Type of IC Test Socket Do You Need?

IC test socket selection depends on the package, electrical requirements, test environment and expected number of insertions. AnySilicon can help you identify suppliers for common package types as well as custom applications.

BGA Test Sockets
QFN Test Sockets
WLCSP Test Sockets
LGA Test Sockets
Burn-In Sockets
RF / High-Speed Sockets

IC Test Socket Manufacturers

Browse IC test socket suppliers that support semiconductor development, characterization and production test. Supplier capabilities can vary by package type, pitch, bandwidth, current, temperature range and test-volume requirements.

How to Choose an IC Test Socket Supplier

The correct socket is not determined by package name alone. A BGA or QFN socket that works well for low-frequency bench testing may not be suitable for a high-speed interface, high-current device, automotive temperature range or automated production environment.

Selection Factor What to Check
Package BGA, QFN, WLCSP, LGA or another package; include body dimensions and pitch.
Electrical performance Signal frequency, bandwidth, contact resistance, inductance and signal-integrity requirements.
Current Maximum current per contact and power requirements for the device under test.
Temperature Room-temperature characterization, hot/cold testing or burn-in temperature range.
Mechanical life Expected insertion cycles and required contact durability.
Test environment Bench evaluation, characterization, ATE, handler, burn-in board or high-volume production.
Volume Prototype quantity versus repetitive production use.

Engineering, Characterization and Production Test

Test socket requirements change throughout the semiconductor product lifecycle. During first-silicon bring-up and characterization, engineers may prioritize easy DUT access, measurement flexibility and fast socket availability. Production testing places greater emphasis on repeatability, insertion life, contact performance and compatibility with automated equipment.

For RF and high-speed digital devices, socket parasitics can materially affect measurements. Applications involving SerDes, RF, high-speed memory or precision analog devices may therefore require a socket specifically optimized for signal integrity.

Burn-in applications introduce another set of requirements, including temperature capability, mechanical reliability and long contact life. If the same device will use different sockets during characterization, qualification and production, it is useful to discuss the complete test flow with the supplier rather than sourcing each socket independently.

CONTACT US REGARDING YOUR SOCKET

Information to Include in Your Test Socket RFQ

You do not need a long technical specification to begin a supplier discussion. Providing the following information will normally make it much easier for manufacturers to determine whether they can support your project:

  • IC package type
  • package body dimensions
  • ball or pad pitch
  • ball/pad map or package drawing
  • device frequency or bandwidth
  • maximum current requirement
  • test temperature range
  • engineering or production use
  • expected insertion cycles
  • ATE or handler requirements
  • required socket quantity
  • target delivery date

Need Help Finding an IC Test Socket Supplier?

Send us your package type, pitch, device requirements, test environment and expected quantity. AnySilicon can help connect you with relevant IC test socket manufacturers.

For faster supplier feedback, attach the package drawing or datasheet if available.

Frequently Asked Questions

What is an IC test socket?

An IC test socket provides temporary electrical and mechanical contact between a semiconductor device and the test system without permanently soldering the IC to the test board. It allows devices to be inserted, tested and removed repeatedly.

Which package types are available?

Test sockets are available for many semiconductor packages, including BGA, QFN, WLCSP and LGA. Suppliers can also develop custom sockets when package geometry or electrical requirements cannot be met by a standard product.

What should I send to a test socket manufacturer?

Start with the package drawing, dimensions, pitch, pin or ball map, electrical requirements, temperature range, test application and expected quantity. High-speed and high-current applications should include the relevant performance requirements as early as possible.

Can AnySilicon help with custom test sockets?

Yes. Submit the package and application requirements through the RFQ section above so they can be matched with relevant suppliers in the AnySilicon network.

Note: Final socket selection and validation should be performed with the chosen supplier using the actual device, package and test requirements.

CONTACT US REGARDING YOUR SOCKET

29 results found See AllSend Email to All

ATS Engineering and ChipTest Announce Strategic Collaboration for Test Program Development for Advantest’s customers

Tel Aviv, Israel – March 24, 2022 - ATS Engineering, a leading Israeli test house, and ChipTest Semiconductor IC Test Company, have announced an exclusive collaboration agreement for developing test programs and test interfaces (load boards and probe cards) on the ATS’ Advantest V93000 Smart Scale platform, to support ATS ...

View article

The Future of Semiconductors: A Deep Dive with Scott Bulbrook

This interview features Scott Bulbrook, President of DA-Integrated.     Can you describe your company's founding vision and how it has evolved to address the changing landscape of the semiconductor industry?   DA-Integrated was founded to address a gap in the industry concerning the availability of test development services for leading-edge Application Specific Integrated Circuits ...

View article

Introduction to LoadBoard Design and Production

LoadBoard (LB) is a mandatory, custom made PCB, that acts as a mechanical and electrical interface between the tester (ATE) and the device under test (DUT). LoadBoard has well-defined physical dimensions and it must fit perfectly into the tester.    It is one piece of the entire ASIC Test Solution and it ...

View article

Synergie-CAD

UK

30 years producing Semiconductor test solutions (Hardware and Software). Design, Simulation, Manufacture, Assembly, Test Development and more, all by Synergie-CAD.

Services

Full Turn-key, Semiconductor Test board Design and Simulation, PCB Manufacture and Assembly, Test Development, Wafer Probe solutions, Burn-in Systems

View vendor page

What is a Burn-in Board?

Burn in Board is a printed circuit board which functions as a jig in the Burn-in process. The Burn-in Board is used as part of the ASIC reliability testing process during which components are stressed to detect failures. Burn in Boards consist of sockets to accommodate the tested ASICs and ...

View article

IC Package Types and How to Choose One?

Introduction to Integrated Circuit Packaging   Integrated circuit packaging technologies have evolved throughout the years to the point where hundreds of IC package types are available today.    Most applications will require the more general, single-element packaging for integrated circuits and the other components such as resistors, capacitators, antenna etc. However, as the semiconductor ...

View article

Introduction to HTOL

HTOL (High Temperature Operating Life) testing is a stress test defined by JEDEC to define the reliability of IC products, and is an essential part of ASIC qualification tests. This post provides a high-level overview of HTOL test. Obviously, you should refer to the standard if you plan to perform ...

View article

Highest Performance Interlaken Chip-to-Chip Interface IP Core

Open-Silicon’s eighth-generation Interlaken IP supports up to 1.2Tbps high-bandwidth performance and up to 56Gbps SerDes rates with Forward Error Correction (FEC). This high-speed chip-to-chip interface IP features an architecture that is fully flexible, configurable and scalable, making it ideal for high-bandwidth networking applications, such as routers, switches, Framer/MAC, OTN switch, ...

View article

What is Semiconductors 3.0?

I am sick and tired to hear the same buzzwords a zillion times every single day. IoT, Cognitive Computing, Cloud Computing, Fog Computing, Big Data, Artificial Intelligence, Smart-whatever (from objects to cities and pretty soon toilet paper, I'm afraid). What really makes me sick is that these buzzwords are used, ...

View article

ASIC Design Flow: From Specification to Silicon

The ASIC design flow takes a chip from product specification through architecture, RTL and circuit design, verification, DFT, synthesis, physical design, signoff and tape-out, followed by wafer fabrication, packaging, wafer sort, final test and production ramp. Each stage has its own technical deliverables and acceptance criteria, and mistakes made early ...

View article
Logo Image
Privacy Overview

This website uses cookies so that we can provide you with the best user experience possible. Cookie information is stored in your browser and performs functions such as recognising you when you return to our website and helping our team to understand which sections of the website you find most interesting and useful.